New Products
Model 2520/KIT1
펄스 레이저 다이오드 측정 키트(Model 2520, 2520INT 및 3피트 triax 케이블 포함)
The Model 2520 Pulsed Laser Diode Test System is an integrated, synchronized system for testing laser diodes early in the manufacturing process, when proper temperature control cannot be easily achieved. The Model 2520 provides all sourcing and measurement capabilities needed for pulsed and continuous LIV (light-current-voltage) testing of laser diodes in one compact, half-rack instrument. The tight synchronization of source and measure capabilities ensures high measurement accuracy, even when testing with pulse widths as short as 500ns.
모델 2520/KIT1의 주요기능
- Simplifies laser diode LIV testing prior to packaging or active temperature control
- Integrated solution for in-process LIV production testing of laser diodes at the chip or bar level
- Sweep can be programmed to stop on optical power limit
- Combines high accuracy source and measure capabilities for pulsed and DC testing
- Synchronized DSP based measurement channels ensure highly accurate light intensity and voltage measurements
- Programmable pulse on time from 500ns to 5ms up to 4% duty cycle
- Pulse capability up to 5A, DC capability up to 1A
- 14-bit measurement accuracy on three measurement channels (VF, front photodiode, back photodiode)
- Measurement algorithm increases the pulse measurement's signal-to-noise ratio
- Up to 1000-point sweep stored in buffer memory eliminates GPIB traffic during test, increasing throughput
- Digital I/O binning and handling operations
- IEEE-488 and RS-232 interfaces
어플리케이션 분야
- 통신 레이저 다이오드
- 광학 스토리지 판독 / 기록 헤드 레이저 다이오드
- 수직 공동면 발광 레이저 (VCSELs)
- 열 임피던스
- 접합 온도반응
사업자등록번호 : 220-86-72761대표이사 : 신동만대표전화 : 070-7872-0701팩스 : 02-2167-3801
(우)07299 서울특별시 영등포구 경인로 775 (문래동 3가, 에이스하이테크시티 3동 2층)
(우)07299 서울특별시 영등포구 경인로 775 (문래동 3가, 에이스하이테크시티 3동 2층)