Model 2410 고 전압 소스 미터 (1100V 및 1A, 20W 전력 출력)

모델	최대/최소 전류	최대/최소 전압	전원
2400 / 2401	1.05 A / 10 pA	200 V / 1 μV ( 20 V 2401 )	20 W
2420 / 2425 / 2440	5.25 A / 100 pA	100 V / 1 μV	60 W / 100 W / 50 W
2410	1.05 A / 10 pA	1100 V / 1 μV	20 W
2430	10.5 A 펄스 / 100 pA	200 V / 1 μV	1100 W

데이터 시트	Series 2400 SourceMeter Line
	Technical Information - Source Measurement Unit (SMU) Instruments
어플리케이션 노트	Pulsed LIV Testing of Low Power Optical Devices with a Model 2520
	#2058 High Voltage Component Production Testing with Two Model 2410 SourceMeter Units
	#1805 Diode Production Testing with the Series 2400 SourceMeter - QuickBASIC Example Programs
	#2154 Testing Devices with High Voltage and High Current
	Automatic Resistance Measurements on High Temperature Superconductors
	#2124 Production Testing of High Current Varistors with the 2430C 1kW Pulse SourceMeter
	Word 6.0 File Discussing the Issues of Ohms Accuracy with the 2400 Series
	Technical Note for SourceMeter Buffers and How to Get Up to 5000 Data Points Using the Two Buffers
	2400 Series Timestamping Technical Note
	Can I generate current (or voltage) pulses with model 2400 or other non-pulse mode SourceMeter?
	Device Characterization Techniques Using Keithley SourceMeter Instruments with LabTracer Software
	Determining output resistance for the 2400 Series SourceMeter
	#2217 Trigger Synchronization of Multiple SourceMeter Instruments
	DC Electrical Characterization of RF Power Transistors
	2218 Production Testing of High-Intensity Visible LEDs
	#2208 Solutions for Production Testing of Connectors
	#2616 Converting a Series 2400 SourceMeter SCPI Application to a Series 2600 System SourceMeter Script Application
	How to Choose and Apply Source Measure Unit SMU Instruments
	Methods to Achieve Higher Currents from I-V Measurement Equipment
	Electrical Characterization of Photovoltaic Materials and Solar Cells with the Model 4200-SCS Semiconductor Characterization System
	#3026 - Electrical Characterization of Photovoltaic Materials and Solar Cells with the Model 4200-SCS Semiconductor Characterization System