New Products
Model ACS 베이직 에디션
반도체 파라메트릭 테스트 소프트웨어
Optimized for parametric testing of component and discrete (packaged) semiconductor devices, ACS Basic Edition maximizes the productivity of technicians and engineers in research and development. The versatile architecture of this software allows it to meet the wide ranging and ever changing requirements of semiconductor device testing. It supports all of Keithley's source and measure instrument products, including Series 2600B, Series 2400, and Model 2651A and Model 2657A SourceMeter® SMU instruments.
Model ACS 베이직 에디션의 주요기능
- Highly configurable, instrument-based system
- Ideal for SMU-per-pin wafer level reliability (WLR) testing, high speed parallel test, die sorting and binning, NBTI, process control monitoring (PCM)
- Intuitive test setup, data gathering and analysis with ACS software
- Keithley's TSP-Link Technology backplane provides high speed measurement throughput
- Flexible solution to meet emerging and mature testing needs
- Full control of automated and semi-automated probers
- Develop and execute tests at the device, site, wafer, and cassette level
관련 어플리케이션
- 재료 및 장치 개발
- 품질 보증
- 장치 검사
관련 자료
사업자등록번호 : 220-86-72761대표이사 : 신동만대표전화 : 070-7872-0701팩스 : 02-2167-3801
(우)07299 서울특별시 영등포구 경인로 775 (문래동 3가, 에이스하이테크시티 3동 2층)
(우)07299 서울특별시 영등포구 경인로 775 (문래동 3가, 에이스하이테크시티 3동 2층)