New Products
Model ACS-2600-RTM
웨이퍼 레벨 신뢰성 옵션
Keithley has taken the power of its Automated Characterization Suite (ACS) software and focused it on wafer level reliability (WLR) testing. ACS-2600-RTM is an option to ACS that leverages the measurement speed and system integration capabilities of Keithley's Series 2600B System SourceMeter® SMU instruments. The result–you can produce lifetime predictions from two to five times faster than you can with conventional WLR test solutions, allowing you to accelerate your technology development, process integration, and process monitoring for faster time to market.
Model ACS-2600-RTM의 주요기능
- Leverages unique strengths of Keithley Series 2600B System SourceMeter® SMU instruments including system scalability and measurement speed
- System configurations from 2 to 44 channels
- Comprehensive JEDEC-compliant test suite
- Optimized for both emerging and mature technologies
- Supports both sequential and parallel testing
- Fully automatic single-site and multi-site capability
- Compatible with all popular wafer probe stations
- Real-time plotting and wafer mapping
관련 어플리케이션
- Device reliability
- HCI, NBTI, and PBTI
- Gate oxide integrity
- TDDB, VRAMP, and JRAMP
- Metal interconnect
- Isothermal electromigration
- Poly heater
- Constant heater
- ILD TDDB
관련 자료
| Data Sheet | ACS-2600-RTM Data Sheet |
| ACS Automated Characterization Suite Software | |
| Model 4200-BTI-A Ultra-Fast NBTI/PBTI Package for the Model 4200-SCS | |
| 제품 자료 | Wafer Level Reliability Systems |
사업자등록번호 : 220-86-72761대표이사 : 신동만대표전화 : 070-7872-0701팩스 : 02-2167-3801
(우)07299 서울특별시 영등포구 경인로 775 (문래동 3가, 에이스하이테크시티 3동 2층)
(우)07299 서울특별시 영등포구 경인로 775 (문래동 3가, 에이스하이테크시티 3동 2층)